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- Auger electron spectrometer 俄歇电子能谱仪
- The simulation of the Auger electron emissions in scanning probe electron energy spectrometer (SPEES) is reported. 报道了对扫描探针电子能谱仪（SPEES）中俄歇电子出射的理论模拟研究。
- Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers 用X射线光电子光谱仪和俄歇电子光谱仪测定影响检测信号的样品面积的标准实施规范
- Auger electron spectrometry 俄歇电子能谱测量
- Some fundamental aspects of Auger electron spectroscopy have been reviewed. 介绍了俄歇电子谱术的某些基本问题。
- Auger electron energy spectrometer 俄歇电子能谱仪
- Raman, Auger Electron Spectroscopy (AES) and X ray Photoelectron Spectroscopy (XPS) were used to analyze the samples. 用拉曼谱 (Raman)、俄歇电子能谱 (AES)以及X射线光电子能谱(XPS)等方法对样品进行研究。
- Survival analysis of C6 glioma DNA-targeting radio-therapy by Auger electron emitted from~(125)Iudr in rats. ~(125)IUdR对胶质瘤细胞靶点放疗后的大鼠生存分析
- GaAs-Al_xGa_(1-x)As heterostructure grown by liquid phase epitaxy (LPE) has beenstudied by Auger electron spectroscope. 采用俄歇电子能谱仪(AES)对液相外延生长的GaAs-AlxGa_(1-x)As异质结构进行了研究.
- The Ge mole fraction of 15-16% was determined by Auger electron spectroscopy (AES). 俄歇电子谱(AES)测试表明，所制备的Si_(1-x)Ge_x中Ge含量约为15-16%25。
- The change of Si/Au interface at the Au-modified Si photoelectrode before and after potential sweep was studied with Auger Electron Spectroscopy (AES). 本文报道了用离子剥层俄歇能谱研究Au修饰Si光电极电位扫描前后Si/Au界面的变化。
- The experiments were performed by means of Secondary Ion Mass Spectroscopy (SIMS) and Auger Electron Spectroscopy (AES). 采用了二次离子质谱仪(SIMS)和俄歇电子谱仪(AES)进行表面分析。
- The interface diffusion phenomena of BTO/Si were systematically studied by Auger electron spectroscopy(AES) and X-ray photoelectron spectroscopy(XPS). 通过俄歇电子能谱(AES),X光电子能谱(XPS)等分析手段系统研究了在Si基片上直接生长BTO铁电薄膜过程中的界面扩散现象。
- Some results of quantitative analysis, including depth quantitative analysis, on Model JAMP-10 Auger Electron Mieroprobc are given. 给出了利用JAMP-10型俄歇电子谱仪进行定量分析(包括深度定量分析)的一些结果。
- Objective To calculate the mean absorbed doses at celluar and subcellular levels for uniformly and non-uniformly distributed Auger electron emitters. 目的给出一种新的方法，计算俄歇电子发射核素在细胞中均匀分布和非均匀分布时细胞和细胞核的平均吸收剂量以及吸收剂量在细胞内的分布。
- The composition of surface layer of uranium and treated uranium have been analyzed respectively by Auger Electron Spectroscopy (AES). 用俄歇电子谱(AES)分析了铀试样处理前后表层的成分变化。
- Abstract The heated oxidation film of U-Nb alloy is studied by auger electron spectroscopy (AES) at different temperature in the high vacuum chamber. 摘要 用俄歇电子能谱(AES)研究了高真空下,环境温度对铀铌合金真空氧化膜的影响。
- Energy olss of electron spectrometer 电子能量损失谱仪
- Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films. 用俄歇电子能谱(AES)、扫描电镜(SEM)和原子力显微镜(AFM)对薄膜的组成成分和表面形貌进行了分析。
- A simple Si(Au) semiconductor electron spectrometer 简易Si(Au)半导体电子谱仪
