Along with the more complicacy of integrated circuit and the emergency of SOC system, the test of IC has become more difficult and this problem has been as the bottleneck of the SOC design.

• 摘要随着集成电路复杂性的提高和SOC系统的出现，电路测试的难度也在不断增大，测试问题已经成为SOC设计的瓶颈。