Abstract: The microstructures of vacancy-type defect in HgCdTe (MCT) samples grown under micro-gravity condition were studied by positron lifetime measurements.

• 文摘:采用正电子湮没寿命谱方法，对空间微重力及重力条件下生长的碲镉汞(MCT)材料中的微观缺陷进行了研究。