3.3 Low Resistance Measurements: Topics include lead resistance, thermoelectric EMFs, non-ohmic contacts, device heating, dry circuit testing, and measuring inductive devices.

• 讨论各种潜在的误差来源以及如何尽量降低它们对低电压测量的准确度的影响。这些误差来源包括偏置电压、噪声和共模电流以及反向误差。