金属诱导横向结晶多晶硅薄膜晶体管热载流子应力退化特性及模型研究

金属诱导横向结晶多晶硅薄膜晶体管热载流子应力退化特性及模型研究的英文翻译

基本释义

• A Study on Hot Carrier Stress Degradation Characteristics and Models of Polycrystalline Silicon Thin Film Transistors Fabricated by Metal-induced Lateral Crystallization